Analytical analysis of modulated signal in apertureless scanning near-field optical microscopy.

@article{Lo2007AnalyticalAO,
  title={Analytical analysis of modulated signal in apertureless scanning near-field optical microscopy.},
  author={Yuan-shaing Lo and Chin Ho Chuang},
  journal={Optics express},
  year={2007},
  volume={15 24},
  pages={15782-96}
}
Eliminating background-scattering effects from the detected signal is crucial in improving the performance of super-high-resolution apertureless scanning near-field optical microscopy (A-SNOM). Using a simple mathematical model of the A-SNOM detected signal, this study explores the respective effects of the phase modulation depth, the wavelength and angle of the incident light, and the amplitude of the tip vibration on the signal contrast and signal intensity. In general, the results show that… CONTINUE READING

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