Analytical Models for the Performance of von Neumann Multiplexing

  title={Analytical Models for the Performance of von Neumann Multiplexing},
  author={George R. Roelke and Rusty. Baldwin and Dursun A. Bulutoglu},
  journal={IEEE Transactions on Nanotechnology},
As conventional silicon CMOS technology continues to shrink, logic circuits are increasingly subject to errors induced by electrical noise. In addition, device reliability will become a problem, and circuits will be subject to permanent faults. Rather than requiring the circuit to be defect-free, fault-tolerance techniques can be incorporated to allow the continued operation of these devices in the presence of defects. We present an improved model for the reliability of nand multiplexing, a… CONTINUE READING


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Parallel information and computation with restitution for noise-tolerant nanoscale logic networks

  • A. S. Sadek, K. Nikolic, M. Forshaw
  • Nanotechnology vol. 15, no. 1, pp. 192–210, 2004…
  • 2004
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