Analysis of the measurement precision of an amorphous silicon EPID used for MLC leaf position quality control and the long-term calibration stability of an optically controlled MLC.

@article{Budgell2008AnalysisOT,
  title={Analysis of the measurement precision of an amorphous silicon EPID used for MLC leaf position quality control and the long-term calibration stability of an optically controlled MLC.},
  author={Geoff J Budgell and Micheal F. Clarke},
  journal={Physics in medicine and biology},
  year={2008},
  volume={53 15},
  pages={N297-306}
}
Electronic portal imaging devices (EPIDs) have been shown to be suitable for multileaf collimator (MLC) leaf positioning quality control (QC). In our centre, a continuous dataset is available of 2 years of film measurements followed by 3 years of EPID measurements on five MLC-equipped linear accelerators of identical head design. The aim of this work was to analyse this unique dataset in order to determine the relative precision of film and EPID for MLC leaf positioning measurements and to… CONTINUE READING