Corpus ID: 198988003

Analysis of the effect of NBTI on data flip time dependency on an MTCMOS SRAM

@inproceedings{Anitha2017AnalysisOT,
  title={Analysis of the effect of NBTI on data flip time dependency on an MTCMOS SRAM},
  author={P. T. Anitha and B. L. Raju},
  year={2017}
}
The predominant restraining factor of the circuits lifespan are Temperature Instability effects like NBTI and PBTI. A regular configuration to evaluate the influence of NBTI on a circuit’s operation is developed relating significant circuit constraints such as the node switching action, variation in supply voltage, temperature etc. The influence of NBTI on Read strength of SRAM cell is analyzed. Due to the NBTI stress, the working of the SRAM is totally affected. The consignment of… Expand

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