Analysis of the degradation of amorphous silicon‐based modules after 11 years of exposure by means of IEC60891:2021 procedure 3

@article{Piliougine2022AnalysisOT,
  title={Analysis of the degradation of amorphous silicon‐based modules after 11 years of exposure by means of IEC60891:2021 procedure 3},
  author={Michel Piliougine and Paula S{\'a}nchez‐Friera and Giovanni Petrone and Francisco Jos{\'e} S{\'a}nchez‐Pacheco and Giovanni Spagnuolo and Mariano Sidrach‐de‐Cardona},
  journal={Progress in Photovoltaics: Research and Applications},
  year={2022},
  volume={30},
  pages={1176 - 1187}
}
The degradation of two amorphous silicon‐based photovoltaic (PV) modules, namely, of single junction amorphous silicon (a‐Si) and of micromorph tandem (a‐Si/ μ ‐Si), after 11 years of exposure in the south of Spain is analyzed. Their I‐V curves were measured outdoors to study the changes of the electrical parameters in the course of three different periods: during the initial days of exposure, during the first year, and in the subsequent 10‐year period. The translation of the curves to an… 

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