Analysis of the Reliability of the Protected Memories Affected by Soft Errors

@inproceedings{Liu2013AnalysisOT,
  title={Analysis of the Reliability of the Protected Memories Affected by Soft Errors},
  author={Xiao-hui Liu and Hong-lei Lin and Wei-hua Mou},
  year={2013}
}
The formulations of mean time to failure and reliability under multiple factors are deduced of the soft errors of space memory systems affected by SEU (single event upsets). A quickly-to-calculate approximate formulas for mean time to failure of memories is produced. The optimal cost function which satisfied the system reliability is obtained by analyzed of the effect of the mean time to failure from four aspects: scrubbing interval, memory size, code word length and error correction capability… CONTINUE READING

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