Analysis of high-power diode laser thermal properties by micro-Raman spectroscopy

Abstract

Spatially resolved micro-Raman measurements have been performed to determine temperature distribution over the facet of high power semiconductor diode lasers. This technique is non-invasive and allows one to study the local temperature on the surface of the mirror of semiconductor diode lasers under normal operating conditions. The micro-Raman measurements can also serve as a calibration of absolute temperature for the other contact-less thermometric methods, e.g., thermoreflectance.

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Cite this paper

@inproceedings{WAWER2006AnalysisOH, title={Analysis of high-power diode laser thermal properties by micro-Raman spectroscopy}, author={DOROTA WAWER and Jens W. Tomm and Kamil Pierscinski and Maciej Bugajski}, year={2006} }