Analysis of heat-treated graphite oxide by X-ray photoelectron spectroscopy

@article{Yamada2013AnalysisOH,
  title={Analysis of heat-treated graphite oxide by X-ray photoelectron spectroscopy},
  author={Y. Yamada and H. Yasuda and K. Murota and M. Nakamura and T. Sodesawa and S. Sato},
  journal={Journal of Materials Science},
  year={2013},
  volume={48},
  pages={8171-8198}
}
  • Y. Yamada, H. Yasuda, +3 authors S. Sato
  • Published 2013
  • Materials Science
  • Journal of Materials Science
  • X-ray photoelectron spectroscopy (XPS) is among the most powerful methods to determine the surface chemical properties of carbon materials. Because heat-treated graphite oxide includes various defects, analyses of the structure by XPS help us understand the structures of various carbon materials. Thus, XPS spectra of graphene-related materials containing various functional groups and other defects on edges and in the basal plane were simulated and full width at half maximums (FWHMs) and peak… CONTINUE READING

    Figures and Tables from this paper.

    Subnanometer vacancy defects introduced on graphene by oxygen gas.
    • 76
    • PDF

    References

    Publications referenced by this paper.
    SHOWING 1-10 OF 79 REFERENCES