Analysis of heat-treated graphite oxide by X-ray photoelectron spectroscopy

@article{Yamada2013AnalysisOH,
  title={Analysis of heat-treated graphite oxide by X-ray photoelectron spectroscopy},
  author={Yasuhiro Yamada and Hajime Yasuda and Kazumasa Murota and Masashi Nakamura and Toshiaki Sodesawa and Satoshi Sato},
  journal={Journal of Materials Science},
  year={2013},
  volume={48},
  pages={8171-8198}
}
X-ray photoelectron spectroscopy (XPS) is among the most powerful methods to determine the surface chemical properties of carbon materials. Because heat-treated graphite oxide includes various defects, analyses of the structure by XPS help us understand the structures of various carbon materials. Thus, XPS spectra of graphene-related materials containing various functional groups and other defects on edges and in the basal plane were simulated and full width at half maximums (FWHMs) and peak… Expand
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