Analysis of a concentric coplanar capacitive sensor for nondestructive evaluation of multi-layered dielectric structures

@article{Chen2010AnalysisOA,
  title={Analysis of a concentric coplanar capacitive sensor for nondestructive evaluation of multi-layered dielectric structures},
  author={Tianming Chen and Nicola Bowler},
  journal={IEEE Transactions on Dielectrics and Electrical Insulation},
  year={2010},
  volume={17}
}
A concentric coplanar capacitive sensor is analyzed for the quantitative characterization of material properties for multi-layered dielectrics. The sensor output signal, transcapacitance CT, is related to the thickness and dielectric constant of each layer of the material under test. Electrostatic Green's functions due to point charges over different dielectric structures are derived utilizing the Hankel transform given the cylindrical symmetry of the proposed sensor. Numerical implementations… CONTINUE READING
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