Analysis of Statistical Sampling in Microarchitecture Simulation: Metric, Methodology and Program Characterization

@article{Kodakara2007AnalysisOS,
  title={Analysis of Statistical Sampling in Microarchitecture Simulation: Metric, Methodology and Program Characterization},
  author={Sreekumar V. Kodakara and Jinpyo Kim and David. J. Lilja and Wei-Chung Hsu and Pen-Chung Yew},
  journal={2007 IEEE 10th International Symposium on Workload Characterization},
  year={2007},
  pages={139-148}
}
Statistical sampling, especially stratified random sampling, is a promising technique for estimating the performance of the benchmark program without executing the complete program on microarchitecture simulators or real machines. The accuracy of the performance estimate and the simulation cost depend on the three parameters, namely the interval size, the… CONTINUE READING