Analysis of Single-Event Transients in Analog Circuits

Abstract

A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data… (More)

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@inproceedings{Adell2001AnalysisOS, title={Analysis of Single-Event Transients in Analog Circuits}, author={P. C. Adell and Ronald D. Schrimpf and Hugh J. Barnaby and O. Mion}, year={2001} }