Analysis of Power Supply Noise in the Presence of Process Variations

@article{Ghanta2007AnalysisOP,
  title={Analysis of Power Supply Noise in the Presence of Process Variations},
  author={Praveen Ghanta and Sarma B. K. Vrudhula},
  journal={IEEE Design & Test of Computers},
  year={2007},
  volume={24}
}
Characterizing the impact of variability on circuit performance measurements (delay, power, and signal integrity) is necessary to avoid chip failure. The authors present a comprehensive methodology for analyzing the impact of device and metal variations on the power supply noise, and hence the signal integrity, of on-chip power grids. 

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