Analysis of Power Supply Noise in the Presence of Process Variations

  title={Analysis of Power Supply Noise in the Presence of Process Variations},
  author={Praveen Ghanta and Sarma B. K. Vrudhula},
  journal={IEEE Design & Test of Computers},
Characterizing the impact of variability on circuit performance measurements (delay, power, and signal integrity) is necessary to avoid chip failure. The authors present a comprehensive methodology for analyzing the impact of device and metal variations on the power supply noise, and hence the signal integrity, of on-chip power grids. 

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Statistical Verification of Power Grids Considering Process-Induced Leakage Current Variations,’

  • I. A. Ferzli, F. N. Najm
  • Proc. Int’l Conf. Computer-Aided Design (ICCAD
  • 2003

Stochastic Finite Elements: A Spectral Approach

  • P. D. Spanos, R. G. Ghanem
  • Dover Publications,
  • 2003

A Methodology for Modeling the Effects of Systematic Within-Die Interconnect and Device Variation on Circuit Performance,’

  • V. Mehrotra
  • Proc. 37th Design Automation Conf. (DAC
  • 2000

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