Analysis of NBTI effects on high frequency digital circuits

  title={Analysis of NBTI effects on high frequency digital circuits},
  author={Ahmet Unutulmaz and Domenik Helms and Reef Eilers and Malte Metzdorf and Ben Kaczer and Wolfgang Nebel},
  journal={2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)},
This paper analyzes some of the secondary effects in estimating negative bias temperature instability (NBTI) induced threshold voltage shift on high frequency digital circuits. Therefore, a circuit model is developed to be used for statistical estimation of the threshold voltage shift. Making use of this model as well as technology computer aided design (TCAD) and SPICE simulations, a methodology is developed to estimate NBTI induced threshold voltage shift. Simulation results reveal that… CONTINUE READING