Analysis of Atomistic Dopant Variation and Fermi Level Depinning in Nanoscale Contacts

@article{Shine2017AnalysisOA,
  title={Analysis of Atomistic Dopant Variation and Fermi Level Depinning in Nanoscale Contacts},
  author={Gautam Shine and Krishna C. Saraswat},
  journal={IEEE Transactions on Electron Devices},
  year={2017},
  volume={64},
  pages={3768-3774}
}
Using quantum transport simulations of metal–semiconductor junctions, we assess the viability of barrier thinning with dopants and barrier lowering with interfacial layers as solutions for contact resistivity in nanoscale transistors. Our atomistic simulations show that the discreteness of dopants leads to increasing variability in contact resistance as dimensions scale below 10 nm. We find that the use of interlayers can counteract low doping caused by atomistic variation, but the interlayer… CONTINUE READING