Analysis and mitigation of process variation impacts on Power-Attack Tolerance

  title={Analysis and mitigation of process variation impacts on Power-Attack Tolerance},
  author={Lang Lin and Wayne P. Burleson},
  journal={2009 46th ACM/IEEE Design Automation Conference},
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impact the data-dependent power of deep submicron cryptosystem designs. In this paper, we use Monte Carlo methods in SPICE circuit simulations to analyze the statistical properties of the data-dependent power with predictive 45nm CMOS device and ITRS process variation models. In addition to the "measurement to disclosure… CONTINUE READING
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