Analysis and mitigation of process variation impacts on Power-Attack Tolerance

@article{Lin2009AnalysisAM,
  title={Analysis and mitigation of process variation impacts on Power-Attack Tolerance},
  author={Lang Lin and Wayne P. Burleson},
  journal={2009 46th ACM/IEEE Design Automation Conference},
  year={2009},
  pages={238-243}
}
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impact the data-dependent power of deep submicron cryptosystem designs. In this paper, we use Monte Carlo methods in SPICE circuit simulations to analyze the statistical properties of the data-dependent power with predictive 45nm CMOS device and ITRS process variation models. In addition to the "measurement to disclosure… CONTINUE READING
Highly Cited
This paper has 33 citations. REVIEW CITATIONS
22 Citations
2 References
Similar Papers

Citations

Publications citing this paper.
Showing 1-10 of 22 extracted citations

References

Publications referenced by this paper.

Similar Papers

Loading similar papers…