Analog circuit sizing using adaptive worst-case parameter sets

@article{Schwencker2002AnalogCS,
  title={Analog circuit sizing using adaptive worst-case parameter sets},
  author={R. Schwencker and F. Schenkel and M. Pronath and H. Graeb},
  journal={Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition},
  year={2002},
  pages={581-585}
}
  • R. Schwencker, F. Schenkel, +1 author H. Graeb
  • Published 2002
  • Engineering, Computer Science
  • Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition
In this paper a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worst-case parameter sets. These sets are calculated adaptively during the sizing process based on sensitivity analyses. The method leads to robust designs with high parametric yield, while being much more efficient than design centering methods. 
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