Analog circuit sizing using adaptive worst-case parameter sets

  title={Analog circuit sizing using adaptive worst-case parameter sets},
  author={Robert Schwencker and Frank Schenkel and Michael Pronath and Helmut E. Graeb},
  journal={Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition},
In this paper a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worst-case parameter sets. These sets are calculated adaptively during the sizing process based on sensitivity analyses. The method leads to robust designs with high parametric yield, while being much more efficient than design centering methods. 

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