Analog VLSI Design Automation [Book Review]

  title={Analog VLSI Design Automation [Book Review]},
  author={Peng Wei Wu},
  journal={IEEE Circuits and Devices Magazine},
  • Peng Wei Wu
  • Published 2005 in IEEE Circuits and Devices Magazine
IEEE CIRCUITS & DEVICES MAGAZINE ■ MAY/JUNE 2005 added using material in Chapters 6–10, and 14, where IDDQ testing, functional testing, delay fault testing, CMOS testing, fault diagnosis, and memory testing are reported. While synthesis for testability and testing at register-transfer, behavior and system-level arguments can be included by using Chapters 13, 15, and 16, where these issues are discussed in depth. The introduction (Chapter 1) and the chapter dealing with memory testing (Chapter… CONTINUE READING

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