An independent component analysis-based filter design for defect detection in low-contrast surface images


In this paper, we propose a convolution filtering scheme for detecting small defects in low-contrast uniform surface images and, especially, focus on the applications for backlight panels and glass substrates found in Liquid Crystal Display (LCD) manufacturing. A defect embedded in a low-contrast surface image shows no distinct intensity from its… (More)
DOI: 10.1016/j.patcog.2006.03.005


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