An in-depth empirical analysis of patent citation counts using zero-inflated count data model: The case of KIST

@article{Lee2007AnIE,
  title={An in-depth empirical analysis of patent citation counts using zero-inflated count data model: The case of KIST},
  author={Yong-Gil Lee and Jeong-Dong Lee and Yong-Il Song and Se-Jun Lee},
  journal={Scientometrics},
  year={2007},
  volume={70},
  pages={27-39}
}
Patent citation counts represent an aspect of patent quality and knowledge flow. Especially, citation data of US patents contain most valuable pieces of the information among other patents. This paper identifies the factors affecting patent citation counts using US patents belonging to Korea Institute of Science and Technology (KIST). For patent citation count model, zero-inflated models are announced to handle the excess zero data. For explanatory factors, research team characteristics… CONTINUE READING
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