An improved test access mechanism structure and optimization technique in system-on-chip

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@article{Jianhua2005AnIT, title={An improved test access mechanism structure and optimization technique in system-on-chip}, author={Feng Jianhua and Long Jieyi and Xu Wenhua and Ye Hongfei}, journal={Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005.}, year={2005}, volume={2}, pages={D/23-D/24 Vol. 2} }