An extension of the Curie-von Schweidler law for the leakage current decay in MIS structures including progressive breakdown

@article{Miranda2011AnEO,
  title={An extension of the Curie-von Schweidler law for the leakage current decay in MIS structures including progressive breakdown},
  author={Enrique Miranda and C. Mahata and Tridip Das and C. K. Maiti},
  journal={Microelectronics Reliability},
  year={2011},
  volume={51},
  pages={1535-1539}
}