An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing

@inproceedings{Nigh1997AnES,
  title={An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing},
  author={Phil Nigh and Wayne M. Needham and Kenneth M. Butler and Peter C. Maxwell and Robert C. Aitken},
  booktitle={VTS},
  year={1997}
}
This paper describes an experiment in which various semiconductor test methodologies (stuck-fault, functional, delay and IDDq) are applied to an ASIC device. The goal Of this Project is to Provide the data that enable Manufacturers to optimize their application of the various tests. This project was supported through SEMATECH (Project S-121, “Semiconductor Test Method Evaluation ”). test does not become a manufacturing bottleneck from either cycle time, product quality or cost point of view… CONTINUE READING
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