An experimental analysis of spot defects in SRAMs: realistic fault models and tests

Abstract

In this paper a complete analysis of spot defects in industrial S R A M s will be presented. All possible defects are simulated, and the resulting electrical faults are transformed into functional fault models. The existence of the usually used theoretical memory fault models will be verified and new on,es will be presented. Finally, a new march test… (More)
DOI: 10.1109/ATS.2000.893615

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@inproceedings{Hamdioui2000AnEA, title={An experimental analysis of spot defects in SRAMs: realistic fault models and tests}, author={Said Hamdioui and Ad J. van de Goor}, booktitle={Asian Test Symposium}, year={2000} }