An electrical-aware parametric DFM solution for analog circuits

Abstract

Today, many of the approaches that are commonly referred to as physical DFM techniques only address catastrophic defects and systematic process variations. These techniques include spreading wires, doubling vias, identification of critical areas in the circuit that are especially susceptible to defects, and identification of proximity effects caused by the… (More)
DOI: 10.1109/IDT.2011.6123104

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