An efficient reliable PUF-based cryptographic key generator in 65nm CMOS

@article{Bhargava2014AnER,
  title={An efficient reliable PUF-based cryptographic key generator in 65nm CMOS},
  author={Mudit Bhargava and Ken Mai},
  journal={2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)},
  year={2014},
  pages={1-6}
}
Physical unclonable functions (PUFs) are primitives that generate high-entropy, tamper resistant bits for use in secure systems. For applications such as cryptographic key generation, the PUF response bits must be highly reliable, consistent across multiple evaluations under voltage and temperature variations. Conventionally, error correcting codes (ECC) have been used to improve response reliability, but these techniques have significant area, power, and delay overheads and are vulnerable to… CONTINUE READING
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