An efficient method of fault simulation for digital circuits modeled from boolean gates and memories

Abstract

The ability to predict the behavior of digital circuits containing faults is required for the verification and automatic generation of fault detection tests, and for the creation of fault dictionaries. The most common method of prediction is with a fault simulation program. Fault simulators simulate the fault-free (good) circuit and each of the possible… (More)

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Cite this paper

@inproceedings{Schuler1977AnEM, title={An efficient method of fault simulation for digital circuits modeled from boolean gates and memories}, author={Donald M. Schuler and Roger K. Cleghorn}, booktitle={DAC}, year={1977} }