An approach for digital Circuit Error/Reliability Propagation Analysis based on Conditional Probability

Abstract

The continuous transistor scaling and extremely lower power constraints in modern VLSI chips can potentially supersede the benefits of the technology shrinking due to reliability issues. Due to external aggression factors, e.g., radiation and temperature gradients, the CMOS devices flawless functioning cannot be guaranteed any more. Thus, design time… (More)

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Cite this paper

@article{Yang2016AnAF, title={An approach for digital Circuit Error/Reliability Propagation Analysis based on Conditional Probability}, author={Bo Yang and Satish Grandhi and Christian Spagnol and Emanuel Popovici and Sorin Cotofana}, journal={2016 27th Irish Signals and Systems Conference (ISSC)}, year={2016}, pages={1-6} }