An analytical model for negative bias temperature instability

  title={An analytical model for negative bias temperature instability},
  author={Shengcheng Wang and Gang Du and Xiao-yan Liu},
  journal={2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology},
Negative bias temperature instability (NBTI) has become one of the major limiters for product lifetime, and various models have been proposed in order to explain NBTI. In this paper, an analytical model for DC NBTI and AC NBTI is proposed. This model describes the different time dependence of DC NBTI degradation at both short- and long-term stresses, and also reproduces the frequency and duty cycle dependencies of NBTI under AC stress. 
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