An analytical model for negative bias temperature instability

@article{Wang2010AnAM,
  title={An analytical model for negative bias temperature instability},
  author={Shengcheng Wang and Gang Du and Xiao-yan Liu},
  journal={2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology},
  year={2010},
  pages={1686-1688}
}
Negative bias temperature instability (NBTI) has become one of the major limiters for product lifetime, and various models have been proposed in order to explain NBTI. In this paper, an analytical model for DC NBTI and AC NBTI is proposed. This model describes the different time dependence of DC NBTI degradation at both short- and long-term stresses, and also reproduces the frequency and duty cycle dependencies of NBTI under AC stress. 
Highly Influential
This paper has highly influenced 11 other papers. REVIEW HIGHLY INFLUENTIAL CITATIONS
Highly Cited
This paper has 197 citations. REVIEW CITATIONS
129 Citations
7 References
Similar Papers

Citations

Publications citing this paper.
Showing 1-10 of 129 extracted citations

197 Citations

02040'09'11'13'15'17
Citations per Year
Semantic Scholar estimates that this publication has 197 citations based on the available data.

See our FAQ for additional information.

References

Publications referenced by this paper.
Showing 1-7 of 7 references

IEEE Transactions on Device and Materials Reliability

  • T. Grasser, W. Gos, B. Kaczer
  • 8, p.79
  • 2008
1 Excerpt

IEEE Transactions on Electron Devices

  • H. Kufluoglu, M. Alam
  • 54, p.1101
  • 2007

Applied Physics Letters

  • J. B. Yang, T. P. Chen, L. Chan
  • 88, 172109
  • 2006

and T

  • S. Zafar, B. H. Lee
  • Ning, Symposium on VLSI Technology Dig., p.208
  • 2004
1 Excerpt

and E

  • S. Rangan, N. Mielke
  • C. C. Yeh, IEDM Technology Dig., p.341
  • 2003
1 Excerpt

Journal of Applied Physics

  • K. O. Jepsson, C. M. Svensson
  • 48, p.2004
  • 1977

Similar Papers

Loading similar papers…