An age-aware library for reliability simulation of digital ICs

@article{Katoozi2013AnAL,
  title={An age-aware library for reliability simulation of digital ICs},
  author={M. Katoozi and E. Cannon and T. Dao and K. Aitken and S. Fischer and T. Amort and R. Brees and J. Tostenrude},
  journal={2013 IEEE International Reliability Physics Symposium (IRPS)},
  year={2013},
  pages={3A.3.1-3A.3.5}
}
A general method for creating an age-aware library of cells, including the impact of multiple reliability degradation mechanisms, is presented. The underlying degradation models take into account key reliability-impacting parameters such as input slew rate, output load, signal toggle rate, signal activity factor, output buffer size and age. A framework for using this age-aware library to analyze the aging of digital Integrated Circuit (IC) timing performance using existing Electronic Design… Expand
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