An Optical/Electrical Test System for 100-Gb/s Optical Interconnection Devices for High Volume Production

Abstract

100-Gb/s optical interconnection devices are expected to be deployed widely in large scale datacenters. In order to improve the productivity of these optical devices, this paper proposes a test solution equipped with 16-lanes of 28-Gb/s both optical and electrical interfaces. In addition to these high-speed ports to test the devices, the test solution also… (More)
DOI: 10.1109/ATS.2016.51

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