An Integrated ISFETs Instrumentation System in Standard CMOS Technology

@article{Chan2010AnII,
  title={An Integrated ISFETs Instrumentation System in Standard CMOS Technology},
  author={Wai Pan Chan and Bhusana Premanode and Christofer Toumazou},
  journal={IEEE Journal of Solid-State Circuits},
  year={2010},
  volume={45},
  pages={1923-1934}
}
This paper describes an integrated ISFETs instrumentation system in a 0.18 μm 1-poly-6-metal CMOS process. The chip is able to compute the average of CMOS ISFETs' threshold voltages by using an averaging array employing global negative current feedback. In addition, neither reference voltage nor current is required to set up the sigma-delta modulator because the internal signal is converted and processed in the frequency domain. The chip operates at 3.3 V for the analog blocks and the digital… CONTINUE READING

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