An Industrial Micro-Defect Diagnosis System via Intelligent Segmentation Region

@inproceedings{Fang2019AnIM,
  title={An Industrial Micro-Defect Diagnosis System via Intelligent Segmentation Region},
  author={Xia Fang and Wang Jie and Tao Feng},
  booktitle={Sensors},
  year={2019}
}
In the field of machine vision defect detection for a micro workpiece, it is very important to make the neural network realize the integrity of the mask in analyte segmentation regions. In the process of the recognition of small workpieces, fatal defects are always contained in borderline areas that are difficult to demarcate. The non-maximum suppression (NMS) of intersection over union (IOU) will lose crucial texture information especially in the clutter and occlusion detection areas. In this… CONTINUE READING

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