An INL Yield Model of the Digital-to-Analog Converter

Abstract

The integral nonlinearity (INL) yield of any arbitrarily segmented digital-to-analog converter (DAC) has not been accurately modeled and requires long simulation time. This paper proposes an intuitive formulation of the INL yield that leads to a simple and accurate relation between the variation of the unit source element and the DAC yield with only a few… (More)
DOI: 10.1109/TCSI.2012.2215114

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