An HDL-Based Platform for High Level NoC Switch Testing

@article{Sedghi2007AnHP,
  title={An HDL-Based Platform for High Level NoC Switch Testing},
  author={Mahshid Sedghi and Armin Alaghi and Elnaz Koopahi and Zainalabedin Navabi},
  journal={16th Asian Test Symposium (ATS 2007)},
  year={2007},
  pages={453-458}
}
This paper presents a non-scan method of NoC switch testing. The method requires addition of test-mode hardware for NoC switches and processing elements which is much less than what is required for most scan methods. Associated with our proposed test-mode of an NoC, we have developed a test environment based on high-level switch faults. The test environment applies test packets to the NoC-under-test in its test-mode and generates an NoC fault dictionary to be used for error detection of an NoC… CONTINUE READING
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Sogomonyan , Partha Pratim Pande , “ On - line Fault Detection and Location for NoC Interconnects ”

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