An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time

@article{Yamaguchi2007AnFJ,
  title={An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time},
  author={Takahiro J. Yamaguchi and H. X. Hou and Koji Takayama and Dave Armstrong and Masahiro Ishida and Mani Soma},
  journal={2007 IEEE International Test Conference},
  year={2007},
  pages={1-8}
}
This paper proposes an FFT-based method that separates random jitter from deterministic jitter in clock and data patterns, with a 10X reduction in test time. The method has been verified experimentally on a 2.5 Gbps clock pattern & 7-stage PRBS, and gives results that are comparable to existing methods.