An Experimental Study of Radiation-induced Demagnetization of Insertion Device Permanent Magnets

@inproceedings{Simos2008AnES,
  title={An Experimental Study of Radiation-induced Demagnetization of Insertion Device Permanent Magnets},
  author={Nicholas Simos and Pierre Job and N. Mokhov},
  year={2008}
}
High brilliance in the 3GeV new light source NSLS II is obtained from the high magnetic fields in insertion devices (ID). The beam lifetime is limited to 3h by single Coulomb scattering in the Bunch (Touschek effect). This effect occurs everywhere around the circumference and there is unavoidable beam loss in the adjacent lowaperture insertion devices. This raises the issue of degradation and damage of the permanent magnetic material by irradiation with high energy electrons and corresponding… CONTINUE READING

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