An Evaluation of MOS Interface-Trap Charge Pump as an Ultralow Constant-Current Generator

@inproceedings{ilingirolu2001AnEO,
  title={An Evaluation of MOS Interface-Trap Charge Pump as an Ultralow Constant-Current Generator},
  author={Uğur Çilingiroğlu and Adriana Becker-Gomez and Kenton T. Veeder},
  year={2001}
}
In this work, we explore the MOS interface-trap charge-pump as an ultralow constant-current generator for analog CMOS applications. Charge pumping techniques in general are more suitable than conventional continuous-time techniques for ultralow current generation because the linear controllability of current by frequency is maintained regardless of the level of current. An interface-trap pump has the same property but the minimum charge it puts out per cycle is at least two orders of magnitude… CONTINUE READING