# An Efficient Topological Characterization of Gray-Levels Textures, Using a Multiresolution Representation

@article{Pikaz1997AnET, title={An Efficient Topological Characterization of Gray-Levels Textures, Using a Multiresolution Representation}, author={Arie Pikaz and Amir Averbuch}, journal={CVGIP: Graphical Model and Image Processing}, year={1997}, volume={59}, pages={1-17} }

- Published in CVGIP: Graphical Model and Image Processing 1997
DOI:10.1006/gmip.1996.0410

Abstract For a given textured image we define a sequence of graphs { N s ( t )} s ∈ I (called MRCG), where N s ( t ) is the number of 4-connected components with size ≥ s , for the images thresholded with t . The sequence of graphs are computed in almost linear time complexity, where the input size is the number of pixels of the image, using only integer arithmetic. The MRCG is a multiresolution representation, which is very useful for texture characterization. Its properties as a texture… CONTINUE READING

#### Citations

##### Publications citing this paper.

SHOWING 1-10 OF 21 CITATIONS

## Multi-resolution Laws’ Masks based texture classification

VIEW 1 EXCERPT

CITES METHODS

## Streaming Algorithm for Euler Characteristic Curves of Multidimensional Images

VIEW 1 EXCERPT

CITES BACKGROUND

## Accurate Automatic Defect Detection Method Using Quadtree Decomposition on SEM Images

VIEW 1 EXCERPT

CITES BACKGROUND

## Utilisation des attributs de texture pour la segmentation par classification pixellaire des images microscopiques.

VIEW 1 EXCERPT

CITES BACKGROUND

## A Texture Classification Method based on Gray-Level Co- Occurrence Matrix and Support Vector Machines

VIEW 2 EXCERPTS

CITES BACKGROUND

## Discovery of Texture Features Using Genetic Programming

VIEW 2 EXCERPTS

CITES BACKGROUND

## Automated visual inspection of ripple defects using wavelet characteristic based multivariate statistical approach

VIEW 1 EXCERPT

CITES BACKGROUND

#### References

##### Publications referenced by this paper.

SHOWING 1-7 OF 7 REFERENCES

## Khalaj , Hamid K . Aghajan , and Tomas Kailath , Patternedfor j r 1 to i do wafer inspection by high resolution spectral estimation techniques , Father [ Path [ j ] ] r root ; Mach

## A max-min measure for image texture analysis

## Defect detection in textured images, ICARCV’92

## An Introduction to Probability Theory and Its Applications, p

#### Similar Papers

Loading similar papers…