An Efficient Pruning Method to Guide the Search of Precision Tests in Statistical Timing Space

@article{Lee2006AnEP,
  title={An Efficient Pruning Method to Guide the Search of Precision Tests in Statistical Timing Space},
  author={Leonard Lee and Li-C. Wang},
  journal={2006 IEEE International Test Conference},
  year={2006},
  pages={1-10}
}
As feature sizes continue to decrease, sensitivities of design to process variations have become harder to analyze. Traditional worst-case and nominal timing analyses are not sufficient to accurately characterize these sensitivities. Timing sensitivities can be classified into timing variability, a direct result of process variations, and timing uncertainty, caused by the interaction between some timing-dependent effects and timing variability. Statistical timing analysis is an emerging… CONTINUE READING

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Automatic Test Pattern Generation. Chapter 21 in EDA handbook for IC system design, verification, and testing

  • K-T. Cheng, Li-C. Wang
  • Edited by Luciano
  • 2006
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