An Automated Recipe-Based Defect Analysis System for ASICs

@inproceedings{Knoch2000AnAR,
  title={An Automated Recipe-Based Defect Analysis System for ASICs},
  author={John Knoch},
  year={2000}
}
  • John Knoch
  • Published 2000
40 Manufacturers of application-specific integrated circuits (ASICs) face some unique yield-management challenges. At any given time, scores of different products and numerous different technologies may be moving through the manufacturing line – some ramping up, some already ramped, and some in a start-up phase. While any competitive semiconductor company must constantly refine and improve its defect detection and correction methodologies, an ASIC house is unmatched in its need for yield… CONTINUE READING