An Approach to Locate Parametric Faults in Nonlinear Analog Circuits

@article{Deng2012AnAT,
  title={An Approach to Locate Parametric Faults in Nonlinear Analog Circuits},
  author={Yong Deng and Yibing Shi and Wei Zhang},
  journal={IEEE Transactions on Instrumentation and Measurement},
  year={2012},
  volume={61},
  pages={358-367}
}
Aiming at the problem to locate parametric faults in nonlinear analog circuits, a new approach based on the subband decomposition combined with coherence functions is proposed. First, the Volterra series of the circuit under test decomposed by wavelet packets are used to detect the parametric faults. Then, the Volterra series in subbands are used to calculate the coherence functions. By comparison with the fault signatures, different states of the parametric faulty circuits are identified, and… CONTINUE READING
Highly Cited
This paper has 19 citations. REVIEW CITATIONS
12 Citations
21 References
Similar Papers

Citations

Publications citing this paper.
Showing 1-10 of 12 extracted citations

References

Publications referenced by this paper.
Showing 1-10 of 21 references

Fault diagnosis of nonlinear analog circuits based on Volterra frequency domain kernel identification

  • B. D. Liu, C. H. Hu
  • Control Decision, vol. 24, no. 8, pp. 1168–1172…
  • 2009
1 Excerpt

A novel method of single fault diagnosis in linear resistive circuit based on slope

  • L. F. Zhou, Y. B. Shi
  • Proc. IEEE Int. Conf. Commun. Circuits Syst., May…
  • 2008
1 Excerpt

The crossentropy method for continuous multi-extremal optimization

  • D. P. Kroese, P. Sergey, R. Y. Rubinstein
  • Methodology Comput. Appl. Probab., vol. 8, no. 3…
  • 2006
2 Excerpts

Similar Papers

Loading similar papers…