An Accelerated Test Method for Predicting the Useful Life of an LED Driver

@article{Han2011AnAT,
  title={An Accelerated Test Method for Predicting the Useful Life of an LED Driver},
  author={Lei Han and Nadarajah Narendran},
  journal={IEEE Transactions on Power Electronics},
  year={2011},
  volume={26},
  pages={2249-2257}
}
This paper proposes an accelerated life-test method for LED drivers that use electrolytic capacitors at the output stage. The type of failure considered here is parametric. Estimated failure rates of power components suggest the electrolytic capacitor used at the driver output stage is the weakest link. As an electrolytic capacitor degrades, its capacitance decreases and its equivalent series resistance increases, contributing to an increase of output current ripple. Thus, the amplitude of the… CONTINUE READING
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