An "Effective" Capacitance Based Delay Metric for RC Interconnect

  title={An "Effective" Capacitance Based Delay Metric for RC Interconnect},
  author={Chandramouli V. Kashyap and Charles J. Alpert and Anirudh Devgan},
Efficient, yet accurate delay estimation for RC interconnect is required for the optimization loop of timing-driven physical design tools. For many applications, the Elmore delay metric [4] has been widely used due to its efficiency and ease of use. However, it is well known that the Elmore metric can have significant error since it ignores the resistive shielding of down-stream capacitance. We present a new interconnect metric called ECM that accounts for this resistive shielding by computing… CONTINUE READING
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