Alternating Strategies for Sequential Circuit ATPG

@inproceedings{Hsiao1996AlternatingSF,
  title={Alternating Strategies for Sequential Circuit ATPG},
  author={Michael S. Hsiao and Elizabeth M. Rudnick and Janak H. Patel},
  booktitle={ED&TC},
  year={1996}
}
This research was supported in part by the Semiconductor Research Corporation under contract SRC 95-DP-109, in part by ARPA under contract DABT63-95-C-0069, and by Hewlett-Packard under an equipment grant. A new sequential circuit test generator, ALT-TEST, is described which alternates repeatedly between two phases of test generation. The first phase uses a simulation-based genetic algorithm, while the second phase uses a deterministic algorithm. The fast execution of the first phase combines… CONTINUE READING

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