Alternating Run-Length Coding – A Technique for Improved Test Data Compression

@inproceedings{Hellebrand2002AlternatingRC,
  title={Alternating Run-Length Coding – A Technique for Improved Test Data Compression},
  author={Sybille Hellebrand and Armin W{\"u}rtenberger},
  year={2002}
}
Store-and-generate techniques encode a given test set and regenerate the original test set during test with the help of a decoder. They are particularly suitable for IP cores coming with pre-computed test sets, and they also offer a natural option for test resource partitioning, because the encoded test data can be stored either on or off chip. Previous research has focused on run-length coding where the test set is considered as a sequence of runs of zero , each run terminated by a one. This… CONTINUE READING
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