Alpha-particle-induced soft errors in dynamic memories

@article{May1979AlphaparticleinducedSE,
  title={Alpha-particle-induced soft errors in dynamic memories},
  author={T. May and M. H. Woods},
  journal={IEEE Transactions on Electron Devices},
  year={1979},
  volume={26},
  pages={2-9}
}
  • T. May, M. H. Woods
  • Published 1979
  • Physics
  • IEEE Transactions on Electron Devices
  • A new physical soft error mechanism in dynamic RAM's and CCD's is the upset of stored data by the passage of alpha particles through the memory array area. The alpha particles are emitted by the radioactive decay of uranium and thorium which are present in parts-per-million levels in packaging materials. When an alpha particle penetrates the die surface, it can create enough electron-hole pairs near a storage node to cause a random, single-bit error. Results of experiments and measurements of… CONTINUE READING
    808 Citations

    Figures and Tables from this paper.

    Paper Mentions

    CMOS DRAM Alpha-Particle Effects
    • R. Zito
    • Materials Science, Engineering
    • Other Conferences
    • 1990
    The Radiation Soft Dynamic RAM as a Particle Detector
    • 4
    • PDF
    Radiation Induced Soft Fails in Space Electronics
    • E. Petersen
    • Physics
    • IEEE Transactions on Nuclear Science
    • 1983
    • 9
    • PDF
    Single Event Upset of Dynamic Rams by Neutrons and Protons
    • 120
    Alpha-Particle-Induced Soft Errors and 64K Dynamic RAM Design Interaction
    • 10

    References

    SHOWING 1-2 OF 2 REFERENCES
    Satellite Anomalies from Galactic Cosmic Rays
    • 379