Aging statistics based on trapping/detrapping: Silicon evidence, modeling and long-term prediction

@article{Velamala2012AgingSB,
  title={Aging statistics based on trapping/detrapping: Silicon evidence, modeling and long-term prediction},
  author={Jyothi Bhaskarr Velamala and Ketul Sutaria and Takashi Sato and Yu Cao},
  journal={2012 IEEE International Reliability Physics Symposium (IRPS)},
  year={2012},
  pages={2F.2.1-2F.2.5}
}
The aging process due to Negative Bias Temperature Instability (NBTI) exhibits a significant amount of variability and thus poses a dramatic challenge for long-term reliability prediction from short-term stress measurement. To develop a robust prediction method in this circumstance, this work first collects statistical device data from a 65nm test chip with a resolution of 0.2mV in threshold voltage (Vth) measurement. By comparing model prediction from short-term stress data (<;20k second) with… CONTINUE READING
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