Aging analysis for recycled FPGA detection

@article{Dogan2014AgingAF,
  title={Aging analysis for recycled FPGA detection},
  author={Halit Dogan and Domenic J. Forte and Mark Mohammad Tehranipoor},
  journal={2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)},
  year={2014},
  pages={171-176}
}
The counterfeit electronic component industry continues to threaten the security and reliability of systems by infiltrating recycled components into the supply chain. With the increased use of FPGAs in critical systems, recycled FPGAs cause significant concerns for government and industry. In this paper, we propose a two phase detection approach to differentiate recycled (used) FPGAs from new ones. Both approaches rely on machine learning via support vector machines (SVM) for classification… CONTINUE READING

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