Aging-Leakage Tradeoffs Using Multi-Vth Cell Library

  title={Aging-Leakage Tradeoffs Using Multi-Vth Cell Library},
  author={Hao Luo and Mehrdad Heydarzadeh and Mehrdad Nourani},
  journal={2016 IEEE 25th Asian Test Symposium (ATS)},
Negative Bias Temperature Instability (NBTI) induced transistor aging has become one of the major reliability concerns in sub-micron circuit as technology scales. Transistor performance degrades over time and may eventually cause timing violations and circuit failure. Multi-Vth is known as a method to improve circuit performance with leakage and timing tradeoffs. In this paper, we propose a heuristic metric, which could be used to capture leakage and timing tradeoff during multi-Vth… CONTINUE READING


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