Advances in atomic resolution in situ environmental transmission electron microscopy and 1Å aberration corrected in situ electron microscopy

@article{Gai2009AdvancesIA,
  title={Advances in atomic resolution in situ environmental transmission electron microscopy and 1{\AA} aberration corrected in situ electron microscopy},
  author={Pratibha L. Gai and Edward D. Boyes},
  journal={Microscopy Research and Technique},
  year={2009},
  volume={72}
}
  • P. GaiE. Boyes
  • Published 1 March 2009
  • Physics
  • Microscopy Research and Technique
Advances in atomic resolution in situ environmental transmission electron microscopy for direct probing of gas‐solid reactions, including at very high temperatures (∼2000°C) are described. In addition, recent developments of dynamic real time in situ studies at the Angstrom level using a hot stage in an aberration corrected environment are presented. In situ data from Pt/Pd nanoparticles on carbon with the corresponding FFT/optical diffractogram illustrate an achieved resolution of 0.11 nm at… 

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